1. Records of the 1999 IEEE International Workshop on memory Technology, Design and Testing, August 9-10, 1999, San Jose, Calif., USA
المؤلف: edited by R. Rajsuman and T. Wik; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology; in cooperation with the IEEE Solid-State Circuits Society
المکتبة: (طهران)
موضوع: Testing -- Congresses ، Semiconductor storage devices,Congresses ، Random access memory
رده :
TK
7895
.
M4I44
1999
